X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 289 BrabA.00010.g.A1.PS00350 at 20.22 mg/mL with 4 mM NAD was mixed 1:1 with Morpheus (b8): 12.5% (w/v) PEG1000, 12.5% (w/v) PEG3350, 12.5% (v/v) MPD, 0.1 M MOPS/HEPES-Na pH 7.5, 0.03 M NaF, 0.03 M NaBr, 0.03 M NaI. Crystal was harvested direct from tray 271654b8 into puck mkn8-10.
Unit Cell:
a: 88.130 Å b: 88.130 Å c: 111.950 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 41 21 2
Crystal Properties:
Matthew's Coefficient: 2.03 Solvent Content: 39.29
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.8000 41.6430 40945 2076 98.6600 0.1616 0.1995 30.0632
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.800 41.643 98.700 0.045 ? 26.720 7.450 ? 40952 ? -3.000 24.800
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.800 1.850 97.600 ? ? 3.590 7.615 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 0.97872 APS 21-ID-F
Software
Software Name Purpose Version
XSCALE data scaling .
PHENIX refinement dev_2499
PDB_EXTRACT data extraction 3.22
MoRDa phasing .
XDS data reduction .