X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 289 Rigaku Reagents PACT screen, optimized condition e6: 24.09% (w/v) PEG 3350, 50 mM sodium formate: TogoA.17199.a.B3.PW38274 at 15 mg/mL: cryo: 20% EG: tray 293956a11: puck utu4-1. For phasing, a crystal from Rigaku Reagents PACT screen condition e6 (18% (w/v) PEG 3350, 200 mM sodium formate) was soaked in reservoir plus 20% 2.5 M NaI in ethylene glycol and vitrified. Anomalous data was collected at the home source. Tray 292844e6: puck hly3-2.
Unit Cell:
a: 36.860 Å b: 53.230 Å c: 96.380 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 1.94 Solvent Content: 36.5
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD FREE R-VALUE 2.0000 35.7250 13372 1423 99.8200 0.1935 0.2607 45.6687
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.000 35.725 99.800 0.059 ? 17.970 6.112 ? 13417 ? -3.000 30.770
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.000 2.050 99.800 ? ? 2.650 3.916 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU FR-E+ SUPERBRIGHT 1.5418 ? ?
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.7.17
PHENIX refinement dev_2499
PDB_EXTRACT data extraction 3.22
XDS data reduction .
ARP model building .