X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.0 293 20% (w/v) PEG 3350, 100 mM sodium citrate/citric acid , 200 mM sodium citrate
Unit Cell:
a: 95.186 Å b: 95.186 Å c: 75.172 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 62
Crystal Properties:
Matthew's Coefficient: 3.82 Solvent Content: 67.80
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.9000 36.1410 30584 1482 99.9900 0.1642 0.1919 41.6343
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.900 47.590 100.000 0.067 ? 18.200 10.300 ? 30616 ? ? 35.910
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.900 1.940 100.000 ? ? ? 9.800 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID 1.00000 APS 17-ID
Software
Software Name Purpose Version
Aimless data scaling 0.5.15
PHASER phasing 2.5.7
PHENIX refinement (dev_2510: ???)
PDB_EXTRACT data extraction 3.22