X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293 180 mM Li2SO4, 90 mM HEPES-Na (pH 7.5), 22.5% (w/v) PEG3350, 10 mM sarcosine
Unit Cell:
a: 98.496 Å b: 67.503 Å c: 69.638 Å α: 90.000° β: 134.920° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.30 Solvent Content: 46.59
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.4050 49.3080 12643 615 99.8500 0.2130 0.2330 61.7128
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.400 50.000 100.000 0.080 ? 5.500 6.600 ? 12646 ? ? 48.860
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.400 2.440 99.800 ? ? ? 5.600 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 95 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-17A 0.97875 Photon Factory BL-17A
Software
Software Name Purpose Version
HKL-2000 data scaling .
PHENIX refinement 1.11.1_2575
PDB_EXTRACT data extraction 3.24
HKL-2000 data reduction .
AutoSol phasing .