X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 3.4 289 PEG 3350
Unit Cell:
a: 66.319 Å b: 66.319 Å c: 39.083 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 41
Crystal Properties:
Matthew's Coefficient: 1.63 Solvent Content: 24.45
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.9510 23.6260 5518 524 87.8000 0.1843 0.2100 20.4138
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.950 50.000 97.000 0.047 ? 14.200 5.900 ? 6092 ? ? 17.760
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.950 2.020 84.300 ? ? ? 4.900 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL19U1 0.9785 SSRF BL19U1
Software
Software Name Purpose Version
PHENIX refinement 1.11.1_2575
HKL-2000 data scaling .
PDB_EXTRACT data extraction 3.22
HKL-2000 data reduction .
PHASER phasing .
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