X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 0.7 M NaCl, 3% PEG 6000, 20% MPD, 0.1% Low Melting Agarose
Unit Cell:
a: 98.800 Å b: 98.800 Å c: 256.431 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 31 1 2
Crystal Properties:
Matthew's Coefficient: 3.31 Solvent Content: 62.84
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.4500 85.5600 50474 2618 99.9800 0.1704 0.2253 41.9080
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.450 85.560 100.000 0.109 ? 19.600 12.600 ? 53172 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.450 2.530 100.000 ? ? 5.2 15.100 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.5418 ? ?
Software
Software Name Purpose Version
HKL-3000 data collection .
MOSFLM data reduction 7.2.1
Aimless data scaling 0.5.28
PHASER phasing 2.6.1
REFMAC refinement 5.8.0155
Coot model building 0.8.6
PDB_EXTRACT data extraction 3.22