X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 0.7 M NaCl, 3% PEG 6000, 25% MPD
Unit Cell:
a: 98.590 Å b: 98.590 Å c: 256.151 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 31 1 2
Crystal Properties:
Matthew's Coefficient: 3.29 Solvent Content: 62.64
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.8000 85.3800 33829 1705 99.9900 0.1586 0.2265 40.8410
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.800 85.380 100.000 0.145 ? 13.600 9.900 ? 35596 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.800 2.940 100.000 ? ? 4.9 9.900 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.5418 ? ?
Software
Software Name Purpose Version
HKL-3000 data collection .
MOSFLM data reduction 7.2.1
Aimless data scaling 0.5.28
PHASER phasing 2.6.1
REFMAC refinement 5.8.0155
Coot model building 0.8.6
PDB_EXTRACT data extraction 3.22