X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.2 293 20% Polyethylene glycol 8000, 0.1 M phosphate-citrate pH 4.2, 0.2 M NaCl
Unit Cell:
a: 67.541 Å b: 68.059 Å c: 76.677 Å α: 89.89° β: 65.15° γ: 87.33°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.29 Solvent Content: 46.39
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? FREE R-VALUE 2.093 30.782 70577 3572 96.77 0.1821 0.2144 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.093 50.0 96.77 ? ? 15.8 3.8 ? 70577 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.0933 2.1208 91.6 ? ? 7.8 3.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U1 0.9798 SSRF BL17U1
Software
Software Name Purpose Version
PHENIX refinement 1.9_1692
HKL-3000 data reduction .
HKL-3000 data processing .
PHENIX phasing .