X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.9 298 32% PEG 4000, ammonium acetate, KH2PO4, 2% PEG 8000
Unit Cell:
a: 103.963 Å b: 103.963 Å c: 81.491 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: H 3 2
Crystal Properties:
Matthew's Coefficient: 2.18 Solvent Content: 43.51
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD FREE R-VALUE 1.7000 37.1210 36176 3629 99.9800 0.1663 0.1940 22.6603
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.700 50.000 100.000 0.272 ? 4.300 38.100 ? 36176 ? ? 18.320
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.700 1.730 100.000 ? ? ? 20.700 942
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-1A 0.9787, 0.9794, 0.9900 Photon Factory BL-1A
Software
Software Name Purpose Version
PHENIX refinement 1.11_2567
SCALEPACK data scaling .
SHELX phasing .
PDB_EXTRACT data extraction 3.22
SHELXD phasing .
HKL-2000 data collection .
SHELXE model building .
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