X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 0.2M CaCl2, 0.1M HEPES, 28% (v/v) PEG 400, pH 7.5
Unit Cell:
a: 93.699 Å b: 93.773 Å c: 130.242 Å α: 98.22° β: 95.34° γ: 120.01°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.78 Solvent Content: 55.74
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.20 49.24 150967 7966 83.97 0.22416 0.24852 53.563
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 50.0 91.4 0.099 ? 14.7 3.3 ? 171703 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.20 2.24 76.2 ? ? 2.5 2.9 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL19U1 0.97846 SSRF BL19U1
Software
Software Name Purpose Version
REFMAC refinement 5.7.0032
HKL-2000 data reduction .
HKL-2000 data scaling .
PHASER phasing .