ISDA: 5WQD

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X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	6.5	293	0.1M MES, 20% PEG8000, 2mM DTT

Unit Cell:

a: 144.616 Å b: 153.267 Å c: 108.029 Å α: 90.000° β: 90.000° γ: 90.000°

Symmetry:

Space Group: P 21 21 2

Crystal Properties:

Matthew's Coefficient: 3.41 Solvent Content: 63.88

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	FREE R-VALUE	3.0000	48.1710	47155	2267	96.7100	0.2351	0.2844	87.7340

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
3.000	50.000	96.400	0.080	?	8.700	7.500	?	47897	?	?	69.100

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	3.000	3.050	79.900	?	?	?	3.400	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 21-ID-F	0.9787	APS	21-ID-F

Software

Software Name	Purpose	Version
PHENIX	refinement	(1.11.1_2575: ???)
HKL-2000	data collection	.
HKL-2000	data processing	.
PHASER	phasing	2.5.6
PDB_EXTRACT	data extraction	3.20
HKL-2000	data reduction	.
HKL-2000	data scaling	.
HKL	data reduction	.
HKL	data scaling	.

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