X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 293 25% (w/v) PEG 3350, 100 mM Bis-Tris, 200 mM MgCl2
Unit Cell:
a: 101.584 Å b: 57.999 Å c: 49.731 Å α: 90.000° β: 112.200° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 1.98 Solvent Content: 37.77
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.5500 30.7660 37519 1853 96.4100 0.1577 0.1849 19.5686
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.550 47.030 96.700 0.075 ? 9.400 3.500 ? 37535 ? ? 14.950
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.550 1.580 96.700 ? ? ? 3.400 1870
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID 1.00000 APS 17-ID
Software
Software Name Purpose Version
Aimless data scaling 0.5.15
PHASER phasing 2.5.7
PHENIX refinement (dev_2838)
PDB_EXTRACT data extraction 3.22
XDS data reduction .