X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 30-35% PEG 4000, 5MM ZNCL2, 0.5M SODIUM ACETATE, TRIS-HCL 0.1M, PH 8.5
Unit Cell:
a: 42.352 Å b: 44.908 Å c: 76.635 Å α: 79.340° β: 90.590° γ: 61.680°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.18 Solvent Content: 43.61
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.2000 50.0 117432 6083 81.3200 0.1334 0.1598 18.3580
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.200 50.0 82.100 0.044 0.044 14.300 4.500 ? 124424 ? -3.0 14.5
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.200 1.220 32.000 ? 0.292 4.4 3.600 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-1 0.9340 ESRF ID14-1
Software
Software Name Purpose Version
HKL-3000 data reduction .
HKL-3000 data scaling .
REFMAC refinement 5.8.0158
PDB_EXTRACT data extraction 3.22
MOLREP phasing .