X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 277 25 mM Tris-HCl (pH 7.5), 250 mM NaCl, 50 mM Arg/Glu, 5% glycerol and 2 mM IP6
Unit Cell:
a: 45.539 Å b: 87.542 Å c: 87.548 Å α: 71.54° β: 84.04° γ: 84.00°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.53 Solvent Content: 65.20
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.000 82.809 80778 1781 93.97 0.1837 0.2118 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.91 82.81 91.8 0.077 ? 11.4 2.7 ? 80778 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.91 1.94 63.7 ? ? 0.5 1.5 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.98 APS 24-ID-E
Software
Software Name Purpose Version
PHENIX refinement 1.9_1692
Coot model building .
XDS data scaling .
PHASER phasing .