X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 277 20% PEG 3350, 0.2 M sodium formate
Unit Cell:
a: 29.986 Å b: 41.878 Å c: 59.895 Å α: 102.080° β: 106.790° γ: 89.360°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.88 Solvent Content: 34.55
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIR FREE R-VALUE 1.7070 29.2270 28201 1427 95.2400 0.1940 0.2262 33.1643
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.70 29.227 96.1 ? ? 15.9 3.5 ? 28278 ? ? 24.970
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.70 1.76 89.9 ? ? 3.5 3.1 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17B1 0.979 SSRF BL17B1
Software
Software Name Purpose Version
HKL-2000 data reduction .
Aimless data scaling .
PHENIX refinement dev_2747
PDB_EXTRACT data extraction 3.22
PHASER phasing .
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