X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 294.15 Crystalls were grown in 20% PEG 3350, 0.2M NH4Cl, soaked briefly for 1-3 min in the formulation with 20-30mM NADH and quickly frozen.
Unit Cell:
a: 96.525 Å b: 107.511 Å c: 119.298 Å α: 63.370° β: 90.040° γ: 89.950°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.46 Solvent Content: 50.09
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.0010 42.9480 282341 14404 97.5800 0.1818 0.2248 29.2999
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.000 50.000 98.100 0.104 ? 6.000 3.900 ? 282997 ? ? 23.850
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.000 2.030 96.800 ? ? ? 3.700 13968
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.2 0.97007 ALS 8.2.2
Software
Software Name Purpose Version
PHENIX refinement 1.10.1_2155
HKL-2000 data scaling .
HKL-2000 data reduction .
PHASER phasing .
PDB_EXTRACT data extraction 3.22
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