X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 291 25% PEG 3350, 0.2 M NaCl, 0.1 M Bis-Tris pH6.5
Unit Cell:
a: 56.607 Å b: 77.509 Å c: 134.794 Å α: 90.000° β: 91.410° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.27 Solvent Content: 45.74
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.7400 25.4800 119034 1188 99.6000 0.2340 0.2750 29.0700
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.740 50.000 99.700 0.102 ? 6.200 3.600 ? 119624 ? ? 22.750
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.740 1.770 100.000 ? ? ? 3.500 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97915 APS 19-ID
Software
Software Name Purpose Version
HKL-3000 data scaling .
BUSTER refinement 2.10.2
PDB_EXTRACT data extraction 3.22
PHASER phasing .
HKL data scaling .
HKL-3000 data reduction .