X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 298 0.3 mM HbRC, 100 mM Tris-HCl (ph 8.2), 600 mM NH4Cl, 0.02 % b-DDM, up to 1% n-heptyl-b-D-glucopyranoside, up to 20 % PEG 500
Unit Cell:
a: 131.358 Å b: 89.714 Å c: 111.637 Å α: 90.00° β: 108.15° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 4.47 Solvent Content: 60.7
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? FREE R-VALUE 2.20 29.08 61363 2936 98.2 0.160 0.191 54.04
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.200 29.100 98.0 ? ? 16.6000 1.900 ? 61415 ? ? 41.31
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.20 2.28 89.0 ? ? 1.70
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 1.0088 APS 19-BM
Software
Software Name Purpose Version
PHENIX refinement DEV_2450
Aimless data scaling .
BUCCANEER model building .
PDB_EXTRACT data extraction 3.22
XDS data reduction .
PHASER phasing .
SHELXE model building .
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