X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 298 0.1M sodium citrate pH 5.5, 25% PEG4000, 20% 2-propanol, 5 mM DTT, 200 mM NaCl, 5 mM MgCl2
Unit Cell:
a: 40.850 Å b: 69.070 Å c: 82.010 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 1.87 Solvent Content: 34.16
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.5100 52.8300 8302 416 99.1000 0.2230 0.2720 98.0100
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.510 52.830 98.900 0.051 ? 16.370 6.354 ? 8332 ? -3.000 89.270
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.510 2.570 93.500 ? ? 1.580 6.309 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.9790 APS 24-ID-C
Software
Software Name Purpose Version
XSCALE data scaling .
BUSTER refinement 2.10.3
PDB_EXTRACT data extraction 3.22
XDS data reduction .
Coot model building .