ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.5	293	0.03 M NaNO3, 0.03 M Na2HPO4, 0.03 M (NH4)2SO4, 0.05 M HEPES pH 7.5, 0.05 M MOPS pH 7.5, 12 % (v/v) ethylene glycol, 9 % (w/v) PEG 8000

Unit Cell:

a: 103.118 Å b: 97.182 Å c: 190.510 Å α: 95.52° β: 80.97° γ: 88.71°

Symmetry:

Space Group: P 1

Crystal Properties:

Matthew's Coefficient: 3.44 Solvent Content: 64.28

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	4.11	49.77	43940	2200	81.29	0.29032	0.31861	112.283

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
4.11	49.77	94.4	0.064	?	18.8	3.8	?	53553	?	?	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	4.11	4.18	76.1	?	?	?	3.5	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		93 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 21-ID-F	0.97872	APS	21-ID-F

Software