X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 298 20% w/v PEG-3350 0.2M ammonium citrate, pH 7.0
Unit Cell:
a: 129.034 Å b: 92.944 Å c: 80.394 Å α: 90.00° β: 120.14° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.82 Solvent Content: 56.40
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.403 43.342 31961 1599 99.64 0.1869 0.2414 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.400 50.000 99.800 0.146 ? 7.000 7.500 ? 31978 ? ? 39.790
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.400 2.490 98.300 ? ? ? 6.400 3133
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-BM 1.0000 APS 22-BM
Software
Software Name Purpose Version
PHENIX refinement (dev_2666: ???)
HKL-2000 data collection .
HKL-2000 data scaling .
PDB_EXTRACT data extraction 3.22
HKL-2000 data reduction .
PHENIX phasing dev-2666
DENZO data reduction .
SCALEPACK data scaling .