X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 291 pH 6.5 0.1M MES/Imidazole, 12.5?% PEG1000, 12.5?% PEG3350, 12.5?% MPD, 0.03M NaNO3, 0.03M Na2HPO4, 0.03M (NH4)2 SO4
Unit Cell:
a: 33.191 Å b: 54.289 Å c: 84.396 Å α: 105.18° β: 90.02° γ: 107.50°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.17 Solvent Content: 43.43
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.830 38.034 46245 2208 97.04 0.1597 0.1911 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.83 48.83 97.1 0.057 ? 12.3 3.1 ? 46256 ? ? 15.21
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.83 1.87 95.3 ? ? 1.9 3.0 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.00 APS 22-ID
Software
Software Name Purpose Version
PHENIX refinement dev_2614
XDS data reduction .
Aimless data scaling .
PHASER phasing .