X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 302 0.1 M Bis-tris propane, 2 M ammonium sulphate. Cryoprotected in perfluoropolyether cryo-oil
Unit Cell:
a: 83.436 Å b: 88.222 Å c: 112.072 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: F 2 2 2
Crystal Properties:
Matthew's Coefficient: 2.49 Solvent Content: 50.55
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.6310 34.6600 25499 2006 98.5500 0.1894 0.2188 27.9941
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.630 50.000 99.100 0.052 ? 63.000 6.700 ? 25599 ? ? 19.790
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.630 1.660 100.000 ? ? ? 6.600 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 1.54178 ? ?
Software
Software Name Purpose Version
PHENIX refinement 1.12_2829
HKL-2000 data collection 708c
HKL-2000 data scaling 708c
PHASER phasing 2.5.5
PDB_EXTRACT data extraction 3.22
HKL-2000 data reduction .
HKL data reduction .
HKL data scaling .
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