X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8 293 0.3M Tris, 0.5mM Zinc Acetate, 425mM Sodium Citrate
Unit Cell:
a: 78.0936 Å b: 78.0936 Å c: 78.0936 Å α: 90.0° β: 90.0° γ: 90.0°
Symmetry:
Space Group: I 21 3
Crystal Properties:
Matthew's Coefficient: 3.46 Solvent Content: 64.46
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.17463871031 31.8815786962 26218 1250 98.8053514226 0.141607998932 0.154946032189 20.6373690427
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.175 31.882 98.81 0.063 ? 18.03 8.9 ? 26219 ? ? 11.9674972676
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.175 1.217 89.84 ? ? 3.88 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL12-2 0.9795 SSRL BL12-2
Software
Software Name Purpose Version
PHENIX refinement 1.9_1692+SVN
XDS data reduction .
XDS data scaling .
PHENIX phasing .
PHENIX model building .