X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 298 K | ? |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| ROTATING ANODE | RIGAKU RU200 | 1.5418 | ? | ? |
| Software Name | Purpose | Version |
|---|---|---|
| HKL-2000 | data collection | . |
| SCALEPACK | data scaling | . |
| MOLREP | phasing | . |
| REFMAC | refinement | refmac_5.8.0155 |
| PDB_EXTRACT | data extraction | 3.22 |
| HKL-2000 | data reduction | . |
| Sir2014 | phasing | . |
| DENZO | data reduction | . |
