5U3P

X-RAY DIFFRACTION


Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 0.2 M di-sodium hydrogen phosphate, 20% PEG 3350
Unit Cell:
a: 42.486 Å b: 48.163 Å c: 57.129 Å α: 86.140° β: 82.320° γ: 82.290°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.37 Solvent Content: 48.08
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.5000 27.2870 64453 1964 90.0400 0.1887 0.2111 28.2843
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.500 27.287 93.300 0.059 ? 15.100 2.500 ? 65896 ? ? 18.960
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.500 1.530 93.100 ? ? ? 2.300 3230
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.0 APS 22-ID
Software
Software Name Purpose Version
HKL-2000 data collection .
HKL-2000 data scaling .
PHENIX refinement 1.8.4_1496
PDB_EXTRACT data extraction 3.22
HKL-2000 data reduction .
PHASER phasing .