X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 291 100 mM Bis-Tris pH 5.8 26% (W/V) PEG3350 260 mM Ammonium Sulfate
Unit Cell:
a: 86.497 Å b: 420.860 Å c: 176.418 Å α: 90.000° β: 98.560° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.67 Solvent Content: 53.95
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 7.0860 49.1870 18596 1887 98.5700 0.2760 0.2980 414.5644
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
7.086 50.000 98.900 0.105 ? 6.200 4.500 ? 18657 ? ? 401.870
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 7.100 7.220 92.600 ? ? ? 4.500 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.979 APS 24-ID-E
Software
Software Name Purpose Version
ADSC data collection .
HKL-2000 data scaling .
PHENIX refinement .
PDB_EXTRACT data extraction 3.20
HKL-2000 data reduction .
PHASER phasing .
DENZO data reduction .
SCALEPACK data scaling .
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