X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 293 K | ? |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| FREE ELECTRON LASER | SLAC LCLS BEAMLINE CXI | 1.5498 | SLAC LCLS | CXI |
| Software Name | Purpose | Version |
|---|---|---|
| REFMAC | refinement | 5.8.0069 |
| PDB_EXTRACT | data extraction | 3.20 |
| CrystFEL | data scaling | 0.6.2-984ba3a8 |
| CrystFEL | data reduction | 0.6.2-984ba3a8 |
