X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.0 293 2.5 M AmSO4, 100 mM Na Acetate, pH 5.0
Unit Cell:
a: 60.862 Å b: 124.502 Å c: 146.159 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 2 2 2
Crystal Properties:
Matthew's Coefficient: 2.79 Solvent Content: 55.96
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.6920 47.3890 15432 832 97.4400 0.2139 0.2561 51.4300
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.680 47.389 96.000 0.119 ? 5.600 1.700 ? 15432 ? ? 39.520
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.680 2.730 96.100 ? ? ? 1.600 1443
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.97925 APS 24-ID-E
Software
Software Name Purpose Version
PHENIX refinement 1.8.2_1309
HKL-2000 data reduction .
HKL-2000 data scaling .
PHASER phasing 2.5.7
PDB_EXTRACT data extraction 3.20
Coot model building .
DENZO data reduction .
SCALEPACK data scaling .