X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 293 20% PEG 3350, 0.1 Na Citrate, pH 5.5, 4% Acetonitrile
Unit Cell:
a: 47.198 Å b: 58.161 Å c: 51.567 Å α: 90.00° β: 93.72° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.99 Solvent Content: 38.19
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.50 33.67 41475 2199 98.55 0.18819 0.21538 26.679
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.500 50.000 99.200 0.066 ? 8.000 3.700 ? 44280 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.500 1.550 93.100 ? ? ? 3.000 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 190 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-G 1.0 APS 21-ID-G
Software
Software Name Purpose Version
REFMAC refinement 5.8.0135
HKL-2000 data collection .
HKL-2000 data scaling .
PHASER phasing 2.5.2
PDB_EXTRACT data extraction 3.20
DENZO data reduction .
SCALEPACK data scaling .
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