X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 290 33% (v/v) Pentaerythritol ethoxylate, 50 mM ammonium sulfate, 50 mM Bis-Tris pH 6.5
Unit Cell:
a: 44.310 Å b: 45.059 Å c: 52.649 Å α: 114.730° β: 90.770° γ: 90.810°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.47 Solvent Content: 50.27
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.3000 19.0300 83124 4188 91.4000 0.1910 0.2100 22.0300
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.30 47.811 92.400 ? 0.061 8.200 1.800 ? 83159 ? ? 17.240
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.30 1.380 89.900 ? ? 2.400 1.800 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID 1.000 APS 17-ID
Software
Software Name Purpose Version
SCALA data scaling 3.3.16
BUSTER-TNT refinement 2.11.6
PDB_EXTRACT data extraction 3.20
XDS data reduction .
MOLREP phasing .