X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7 289 2% Tacsimate pH 7.0, 3% PEG3350
Unit Cell:
a: 69.948 Å b: 81.187 Å c: 138.062 Å α: 90.380° β: 95.080° γ: 107.390°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.88 Solvent Content: 57.35
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 3.2010 38.9260 39086 1999 82.2800 0.1800 0.2467 49.5499
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.200 50.000 98.600 0.055 ? 9.500 2.100 ? 46508 ? ? 55.760
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.200 3.260 98.300 ? ? ? 2.200 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.979 APS 19-ID
Software
Software Name Purpose Version
HKL-3000 data collection .
HKL-3000 data scaling .
PHASER phasing .
PHENIX refinement 1.10.1_2155
PDB_EXTRACT data extraction 3.20
HKL-3000 data reduction .
Coot model building .
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