X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION . 293.15 33 % PEG4k, 0.2 MgCl2 and 0.1 M Tris
Unit Cell:
a: 49.074 Å b: 59.679 Å c: 80.321 Å α: 79.440° β: 81.820° γ: 75.930°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.41 Solvent Content: 48.99
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION FOURIER SYNTHESIS THROUGHOUT 1.5800 78.5400 107537 5723 95.5000 0.2210 0.2500 30.7650
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.580 47.320 95.600 0.032 ? 9.800 1.700 ? 113271 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.580 1.620 93.100 ? ? ? 1.500 8144
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I04-1 1.000 Diamond I04-1
Software
Software Name Purpose Version
REFMAC refinement 5.8.0189
Aimless data scaling 0.7.1
PDB_EXTRACT data extraction 3.23
XDS data reduction .
REFMAC phasing .
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