X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 20% PEG3550, 0.1 M Bis-Tris propane pH 6.5 and 0.2 M Sodium Iodide
Unit Cell:
a: 59.840 Å b: 61.880 Å c: 65.480 Å α: 70.37° β: 75.83° γ: 89.41°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.57 Solvent Content: 52.14
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.75 51.37 20752 978 93.4 0.185 0.258 18.93
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.75 51.37 96.6 ? ? 9.0 6.0 ? 20752 ? ? 40.67
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 2 1.8369 SOLEIL PROXIMA 2
Software
Software Name Purpose Version
BUSTER refinement 2.10.3
XDS data reduction .
Aimless data scaling .
PHASER phasing .