X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.4 291 0.2 M Ammonium sulphate 20 % PEG3350
Unit Cell:
a: 49.030 Å b: 49.030 Å c: 207.980 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 41 2 2
Crystal Properties:
Matthew's Coefficient: 2.53 Solvent Content: 51.32
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD FREE R-VALUE 2.1400 44.3480 14842 784 99.5200 0.2028 0.2501 70.4816
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.14 44.35 99.5 0.092 ? 15.61 12.4 ? 14846 ? ? 50.520
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.14 2.18 98.96 ? ? 1.19 11.9 1430
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID23-1 1.28226 ESRF ID23-1
Software
Software Name Purpose Version
PHENIX refinement 1.11.1_2575
XDS data reduction .
Aimless data scaling .
SHELXDE phasing .
PDB_EXTRACT data extraction 3.22