ELECTRON MICROSCOPY

Sample

Tra1 subunit of SAGA complex

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details Blot for 1 second before plunging
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 105916
Reported Resolution (Å) 5.7
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol RIGID BODY FIT
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details Secondary structure restraints were applied in Phenix.
Data Acquisition
Detector Type FEI FALCON II (4k x 4k)
Electron Dose (electrons/Å2) 60
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TITAN KRIOS
Minimum Defocus (nm) 1400
Maximum Defocus (nm) 3400
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 0.001
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 59000
Calibrated Magnification 127272
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION Gautomatch 0.53
IMAGE ACQUISITION EPU 1.4.3.1159REL
CTF CORRECTION Gctf 0.50
CTF CORRECTION CTFFIND 4.0.15
MODEL FITTING UCSF Chimera 1.9
MODEL FITTING Situs 2.6
FINAL EULER ASSIGNMENT RELION 1.4
RECONSTRUCTION RELION 1.4
MODEL REFINEMENT Coot 0.8.7
MODEL REFINEMENT PHENIX 1.11
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION Full CTF correction in Relion
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