X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 292 Midas 1-30: 40% 5/4 PO/OH 100 mM Mes pH 6.0
Unit Cell:
a: 129.883 Å b: 129.883 Å c: 129.883 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: F 2 3
Crystal Properties:
Matthew's Coefficient: 2.35 Solvent Content: 47.8
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.28 45.92 44461 2368 99.98 0.12366 0.14759 14.353
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.28 45.92 99.9 0.041 ? 21.2 8.9 ? 46835 ? ? 11.4
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.28 1.30 99.0 ? ? 3.9 8.1 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.93221 SOLEIL PROXIMA 1
Software
Software Name Purpose Version
REFMAC refinement 5.8.0158
XDS data reduction 20160617
Aimless data scaling 0.5.31
PHASER phasing 2.7.17