X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 277.15 90mM of LiNaK (0.3M lithium sulphate, 0.3M sodium sulphate, 0.3 M potassium sulphate), 0.1M of buffer system 4 (1M MOPSO, 1M Bis-Tris) pH 6.5 and 50% precipitant mix 8 (10% PEG 20000, 50% trimethyl propane, 2% NDSB 195)
Unit Cell:
a: 60.810 Å b: 60.830 Å c: 64.100 Å α: 90.04° β: 92.89° γ: 101.98°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.20 Solvent Content: 61.57
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.630 32.264 107482 5155 95.98 0.1675 0.1938 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.63 32.27 96 0.09 ? 6.7 1.8 ? 107492 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.63 1.66 94.6 ? ? 1.2 1.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I04 0.99 Diamond I04
Software
Software Name Purpose Version
PHENIX refinement (dev_2621: ???)
XDS data reduction .
XSCALE data scaling .
PHASER phasing .
PHENIX model building .
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