X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.76 293 0.1 M MES pH 5.76, 0.378 M KCl, 21.7 % PEG 3350
Unit Cell:
a: 143.580 Å b: 143.580 Å c: 62.320 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 4
Crystal Properties:
Matthew's Coefficient: ? Solvent Content: ?
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 3.1000 45.4040 11670 581 99.5400 0.2543 0.2781 40.3900
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.100 45.404 99.600 0.167 ? 11.450 5.510 ? 11680 ? -3.000 49.150
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.100 3.200 100.000 ? ? 2.220 5.547 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.5418 ? ?
Software
Software Name Purpose Version
PHENIX refinement 1.10_2155
XSCALE data scaling .
PHASER phasing .
PDB_EXTRACT data extraction 3.22
XDS data reduction .
Feedback Form
Name
Email
Institute
Feedback