X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 3 M Na formate, 0.1 M Bis Tris pH 6
Unit Cell:
a: 31.433 Å b: 50.794 Å c: 53.642 Å α: 76.420° β: 89.330° γ: 94.740°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.78 Solvent Content: 30.97
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.6000 52.1200 37886 1917 89.3000 0.2320 0.2640 35.7500
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 52.12 89.8 ? ? 9.78 1.8 ? 37888 ? ? 28.080
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.6 1.660 90.1 ? ? 1.93 1.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID29 0.97625 ESRF ID29
Software
Software Name Purpose Version
BUSTER refinement 2.11.7
XSCALE data scaling .
PHASER phasing .
PDB_EXTRACT data extraction 3.22
XDS data reduction .