5NF4

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.0 293 3% PGA, 8% PEG 8000, 0.3 M sodium formate, 0.12 M ammonium sulfate and 0.1 M sodium acetate, pH 5.0.
Unit Cell:
a: 80.183 Å b: 80.183 Å c: 116.022 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 32
Crystal Properties:
Matthew's Coefficient: 3.09 Solvent Content: 60.19
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? FREE R-VALUE 1.7460 44.5200 78991 6008 93.2200 0.1506 0.1773 53.3268
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.721 69.441 93.200 ? 0.032 12.200 1.700 79050 79050 ? ? 33.630
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.750 1.840 93.400 ? 0.365 2.100 1.700 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID29 0.97623 ESRF ID29
Software
Software Name Purpose Version
SCALA data scaling 3.3.22
PHENIX refinement 1.9_1692
PDB_EXTRACT data extraction 3.22
XDS data reduction .