X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293 0.1M HEPES, 15% PEG MME 5,000, 0.05M Ammonium Acetate
Unit Cell:
a: 100.002 Å b: 66.103 Å c: 104.119 Å α: 90.000° β: 90.130° γ: 90.000°
Symmetry:
Space Group: P 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.57 Solvent Content: 52.08
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.3000 66.1000 20143 1009 96.8000 0.1890 0.2430 169.1100
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.300 66.100 99.100 0.149 ? 5.710 3.368 ? 20621 ? -3.000 145.290
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.300 3.390 99.500 ? ? 0.320 3.337 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.999920 SLS X10SA
Software
Software Name Purpose Version
XSCALE data scaling .
BUSTER refinement 2.11.6
PDB_EXTRACT data extraction 3.22
XDS data reduction .
PHASER phasing .