ELECTRON MICROSCOPY

Sample

Thin filament at high calcium concentration

Specimen Preperation
Sample Aggregation State FILAMENT
Vitrification Instrument
Cryogen Name
Sample Vitrification Details
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 1680
Reported Resolution (Å) 27.7
Resolution Method FSC 0.5 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID
Refinement Space
Refinement Protocol
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector Type AGFA SCIENTA FILM
Electron Dose (electrons/Å2) 12
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI/PHILIPS CM12
Minimum Defocus (nm) ?
Maximum Defocus (nm) ?
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS ?
Imaging Mode BRIGHT FIELD
Specimen Holder Model ?
Nominal Magnification ?
Calibrated Magnification ?
Source LAB6
Acceleration Voltage (kV) 120
Imaging Details ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
NONE ?