X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293 1.6 M (NH4)2SO4, 0.1 M HEPES, 0.1 M NaCl, 0.1 M NADH, 0.15 M FAD, 10% Glycerol, anaerobic crystallization 0.0005 mM XiaP (protein, reductase)
Unit Cell:
a: 166.930 Å b: 167.090 Å c: 200.940 Å α: 89.96° β: 90.18° γ: 119.82°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 4.59 Solvent Content: 73.19
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.40 15.00 665721 35038 95.12 0.19975 0.22881 38.471
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.4 30 95.5 0.098 ? 7.4 1.9 ? 703582 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.4 2.5 94.8 ? ? 2.0 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 1.0 SLS X10SA
Software
Software Name Purpose Version
REFMAC refinement 5.8.0158
XDS data reduction .
XSCALE data scaling .
PHASER phasing .