X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 295 K | First data set containing reflections from X-ray diffraction |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| SYNCHROTRON | PETRA III, EMBL c/o DESY BEAMLINE P14 (MX2) | 0.7749 | PETRA III, EMBL c/o DESY | P14 (MX2) |
| Software Name | Purpose | Version |
|---|---|---|
| PHENIX | refinement | (dev_2429) |
| XDS | data reduction | . |
| HKL-2000 | data reduction | . |
| XDS | data scaling | . |
| HKL-2000 | data scaling | . |
| PHASER | phasing | . |
| Coot | model building | . |
