X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7 294 0,4M NaCl, 10mM TRIS, 22% PEG3350
Unit Cell:
a: 112.500 Å b: 116.700 Å c: 123.300 Å α: 103.90° β: 104.30° γ: 114.70°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.24 Solvent Content: 62.03
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.97 39.97 96800 5097 97.1 0.242 0.311 71.05
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.970 121.000 97.5 0.09100 ? 11.9200 3.490 ? 101917 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.97 3.17 91.8 ? 2.200 3.54 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BESSY BEAMLINE 14.2 0.918007 BESSY 14.2
Software
Software Name Purpose Version
REFMAC refinement 5.7.0029
XDS data reduction .
XDS data scaling .
MOLREP phasing .