X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 293 0.1 M Tris-HCl pH 8.0, 0.3 M Mg(NO3)2, 23 % w/v PEG 2000; Cryoprotection in 0.1 M Tris HCl pH 8.0, 50 mM MgCl2, 35 % w/v PEG 3350
Unit Cell:
a: 47.660 Å b: 57.070 Å c: 71.310 Å α: 82.420° β: 75.790° γ: 76.880°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.28 Solvent Content: 45.96
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.3000 45.2440 30125 709 95.9700 0.2045 0.2528 68.6337
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.300 45.25 95.900 0.059 ? 8.460 1.8 ? 30125 ? -3.000 46.510
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.300 2.400 95.800 ? ? 1.090 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.954 SLS X10SA
Software
Software Name Purpose Version
PHENIX refinement 1.10.1_2155
XSCALE data scaling .
PDB_EXTRACT data extraction 3.20
XDS data reduction .
PHASER phasing .