X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 0.1 M Na-MES pH 6.5, 0.2 M CaCl2,0.6 M NaCl, 20 % w/v PEG 3350; 3% w/v 1,6-diaminohexane in drop
Unit Cell:
a: 48.330 Å b: 56.570 Å c: 78.110 Å α: 104.280° β: 104.240° γ: 102.180°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.39 Solvent Content: 48.62
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.0000 44.9150 48657 1453 96.8200 0.2117 0.2427 33.7508
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.000 44.9150 96.700 0.048 ? 18.340 3.5 ? 48658 ? -3.000 27.210
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.000 2.100 95.800 ? ? 4.380 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.9786 SLS X10SA
Software
Software Name Purpose Version
PHENIX refinement 1.10.1_2155
XSCALE data scaling .
PDB_EXTRACT data extraction 3.20
XDS data reduction .
PHASER phasing .
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