X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 20 mM BIS-tris propane, 50 mM NaCl, 10 mM glycerol, 0.2 M Li sulphate, 0.1 mM Tris-HCl pH 7.5 and 5% w/v PEG 4000, 50 mM RuBP
Unit Cell:
a: 107.154 Å b: 107.154 Å c: 107.154 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 3
Crystal Properties:
Matthew's Coefficient: 2.12 Solvent Content: 41.97
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.4500 47.9200 72565 3659 99.9700 0.1660 0.1836 21.3200
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.450 47.920 100.000 0.058 ? 21.700 9.900 ? 72625 ? ? 19.170
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.450 1.470 100.000 ? ? ? 9.600 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID29 0.97239 ESRF ID29
Software
Software Name Purpose Version
Aimless data scaling 0.1.29
BUSTER-TNT refinement 1.10.0
PDB_EXTRACT data extraction 3.20
XDS data reduction November 11, 2013
PHASER phasing 2.5.2