ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	?	293	20 mM BIS-tris propane, 50 mM NaCl, 0.1 mM RuBP, 0.1 mM TrisHCl pH 7, 0.2 mM potassium thiocyanate, 6% poly-alpha-glutamic acid,

Unit Cell:

a: 178.740 Å b: 178.740 Å c: 178.740 Å α: 90.000° β: 90.000° γ: 90.000°

Symmetry:

Space Group: I 21 3

Crystal Properties:

Matthew's Coefficient: 3.3 Solvent Content: 62.5

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	FREE R-VALUE	1.6500	44.6800	113268	5675	100.0000	0.1818	0.1911	32.6600

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.65	44.69	100.000	0.093	?	18.900	20.100	?	113271	?	?	29.15

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.65	1.68	100.000	?	?	2.3	17.6	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	ESRF BEAMLINE ID29	0.97625	ESRF	ID29

Software